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Codes & Standards - Purchase
IEC 60746-1:2003
Expression of performance of electrochemical analyzers - Part 1: General
- English, French
- Published in 2003
- Published by IEC
Codes & Standards - Purchase
IEC 60746-2:2003
Expression of performance of electrochemical analyzers - Part 2: pH value
- English, French
- Published in 2003
- Published by IEC
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IEC 60746-2:2003/COR1:2003
Corrigendum 1 - Expression of performance of electrochemical analyzers - Part 2: pH value
- English
- Published in 2003
- Published by IEC
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IEC 60746-2:2003/COR2:2003
Corrigendum 2 - Expression of performance of electrochemical analyzers - Part 2: pH value
- English
- Published in 2003
- Published by IEC
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IEC 60746-3:2002
Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity
- English, French
- Published in 2002
- Published by IEC
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IEC 60746-3:2002/COR1:2003
Corrigendum 1 - Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity
- English
- Published in 2003
- Published by IEC
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IEC 60746-4:2018
Expression of performance of electrochemical analyzers - Part 4: Dissolved oxygen in water measured by membrane-covered amperometric sensors
- Bilingual
- Published in 2018
- Published by IEC
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IEC 60746-5:1992
Expression of performance of electrochemical analyzers - Part 5: Oxidation-reduction potential or redox potential
- Bilingual
- Published in 1992
- Published by IEC
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IEC 61207-1:2010
Expression of performance of gas analyzers - Part 1: General
- Bilingual
- Published in 2010
- Published by IEC
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IEC 61207-2:2019
Expression of performance of gas analyzers - Part 2: Measuring oxygen in gas utilizing high-temperature electrochemical sensors
- Bilingual
- Published in 2019
- Published by IEC
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IEC 61207-3:2019
Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- Bilingual
- Published in 2019
- Published by IEC
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IEC 61207-3:2019 RLV
Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- English
- Published in 2019
- Published by IEC
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IEC 61207-6:2014
Expression of performance of gas analyzers - Part 6: Photometric analyzers
- Bilingual
- Published in 2014
- Published by IEC
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IEC 61207-7:2013
Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
- Bilingual
- Published in 2013
- Published by IEC
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IEC 61207-7:2013/COR1:2015
Corrigendum 1 - Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
- Bilingual
- Published in 2015
- Published by IEC
Codes & Standards - Purchase
IEC 62703:2013
Expression of performance of fluorometric oxygen analyzers in liquid media
- Bilingual
- Published in 2013
- Published by IEC
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IEC TR 61832:2015
Design and installation of on-line analyser systems - Guide to technical enquiry and bid evaluation
- English
- Published in 2015
- Published by IEC
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IEC TR 62432:2006
The rH index in aqueous and aqueous-organic media
- English
- Published in 2006
- Published by IEC
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IEC TR 62434:2006
pH measurements in difficult media - Definitions, standards and procedures
- English
- Published in 2006
- Published by IEC
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IEC TR 62456:2007
An electrochemical reference system for use in different solvent media - The decamethylated ferricinium/ferrocene redox couple
- English
- Published in 2007
- Published by IEC
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ISO 10810:2019
Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- English
- Published in 2019
- Published by ISO
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ISO 11039:2012
Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- English
- Published in 2012
- Published by ISO
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ISO 11505:2012
Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
- English
- Published in 2012
- Published by ISO
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ISO 11775:2015
Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
- English
- Published in 2015
- Published by ISO
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ISO 11952:2019
Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
- English
- Published in 2019
- Published by ISO
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ISO 12406:2010
Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
- English
- Published in 2010
- Published by ISO
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ISO 12963:2017
Gas analysis -- Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
- English, French
- Published in 2017
- Published by ISO
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ISO 12963:2017/Amd 1:2020
Gas analysis — Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration — Amendment 1: Correction to Formula 5
- English, French
- Published in 2020
- Published by ISO
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ISO 13083:2015
Surface chemical analysis -- Scanning probe microscopy -- Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- English
- Published in 2015
- Published by ISO
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ISO 13084:2018
Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- English
- Published in 2018
- Published by ISO
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ISO 13095:2014
Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- English
- Published in 2014
- Published by ISO
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ISO 13424:2013
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- English
- Published in 2013
- Published by ISO
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ISO 14167:2018
Gas analysis -- General quality aspects and metrological traceability of calibration gas mixtures
- English, French
- Published in 2018
- Published by ISO
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ISO 14237:2010
Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
- English, French
- Published in 2010
- Published by ISO
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ISO 14606:2022
Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
- English
- Published in 2022
- Published by ISO
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ISO 14701:2018
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
- English
- Published in 2018
- Published by ISO
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ISO 14706:2014
Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- English
- Published in 2014
- Published by ISO
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ISO 14707:2021
Surface chemical analysis — Glow discharge optical emission spectrometry (GD-OES) — Introduction to use
- English
- Published in 2021
- Published by ISO
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ISO 14912:2003
Gas analysis -- Conversion of gas mixture composition data
- English
- Published in 2003
- Published by ISO
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ISO 14912:2003/Cor 1:2006
Gas analysis — Conversion of gas mixture composition data — Technical Corrigendum 1
- English
- Published in 2006
- Published by ISO
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ISO 14975:2000
Surface chemical analysis -- Information formats
- English
- Published in 2000
- Published by ISO
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ISO 14976:1998
Surface chemical analysis -- Data transfer format
- English
- Published in 1998
- Published by ISO
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ISO 15470:2017
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- English
- Published in 2017
- Published by ISO
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ISO 15471:2016
Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- English
- Published in 2016
- Published by ISO
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ISO 15472:2010
Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- English, French
- Published in 2010
- Published by ISO
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ISO 15796:2005
Gas analysis -- Investigation and treatment of analytical bias
- English, French
- Published in 2005
- Published by ISO
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ISO 16129:2018
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- English
- Published in 2018
- Published by ISO