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IEC 62374:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
SKU: iec_006940_037851
Published by IEC
Publication Year 2007
1.0 Edition
43 pages
Product Details
Provides a test method of Time Dependent Dielectric Breakdown
(TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure