Codes & Standards - Purchase
IEC 60749-27:2006/AMD1:2012
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
SKU: iec_003365_046944
Published by IEC
Publication Year 2012
2.0 Edition
5 pages
Product Details
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