Codes & Standards - Purchase
a. Addition of cyclic (dynamic) mechanical load testing (MQT 20).
b. Addition of a test for detection of potential-induced degradation (MQT 21).
c. Addition of test methods required for bifacial PV modules.
d. Addition of test methods required for flexible modules. This includes the addition of the bending test (MQT 22).
e. Revision of simulator requirements to ensure uncertainty is both well-defined and minimized.
f. Correction to the hot spot endurance test, where the procedure for monolithically integrated (MLI) thin film technologies (MQT 09.2) previously included two sections describing a procedure only appropriate for silicon modules.
g. Selection of three diodes, rather than all, for testing in the bypass diode thermal test (MQT 18).
h. Removal of the nominal module operating test (NMOT), and associated test of performance at NMOT, from the IEC 61215 series.