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IEC 61445:2012
Digital Test Interchange Format (DTIF)
SKU: iec_005469_046587
Published by IEC
Publication Year 2012
1.0 Edition
101 pages
Product Details
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.