CAN/CSA-ISO/IEC 10373-3:12 (R2016)

Preface

Standards development within the Information Technology sector is harmonized with international standards development. Through the CSA Technical Committee on Information Technology (TCIT), Canadians serve as the Canadian Advisory Committee (CAC) on ISO/IEC Joint Technical Committee 1 on Information Technology (ISO/IEC JTC1) for the Standards Council of Canada (SCC), the ISO member body for Canada and sponsor of the Canadian National Committee of the IEC. Also, as a member of the International Telecommunication Union (ITU), Canada participates in the International Telegraph and Telephone Consultative Committee (ITU-T).

This Standard supersedes CAN/CSA-ISO/IEC 10373-3-02 (adoption of ISO/IEC 10373-3:2001, first edition, 2001-02-15).

At the time of publication, ISO/IEC 10373-3:2010 is available from ISO and IEC in English only. CSA will publish the French version when it becomes available from ISO and IEC.

Scope

This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications.

NOTE Criteria for acceptability do not form part of this part of ISO/IEC 10373 but will be found in the International Standards mentioned above.

This part of ISO/IEC 10373 defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts define other technology-specific tests.

Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this part of ISO/IEC 10373 are based on ISO/IEC 7816-3.

Conformance of cards and IFDs determined using the test methods defined in this part of ISO/IEC 10373 does not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC 10373.

This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. Minimum functionality is defined as follows.

• Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard.
•  Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.