Codes & Standards - Purchase
IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
SKU: iec_003333_029160
Published by IEC
Publication Year 2002
1.0 Edition
15 pages
Product Details
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
The contents of the corrigendum of August 2003 have been included in this copy.