NOTE 1 Criteria for acceptability do not form part of this International Standard but will be found in the International Standards mentioned above.
NOTE 2 Test methods described in this International Standard are intended to be performed separately. A given card is not required to pass through all the tests sequentially.
This part of ISO/IEC 10373 deals with test methods which are specific to optical memory card technology. ISO/IEC 10373‑1 deals with test methods which are common to one or more card technologies and other parts deal with other technology-specific tests.