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ISO 15932:2013
Microbeam analysis -- Analytical electron microscopy -- Vocabulary
SKU: iso_055560_153782
Published by ISO
Publication Year 2013
1 Edition
21 pages
Product Details
ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.