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ISO 24173:2009
Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
SKU: iso_042052_147602
Published by ISO
Publication Year 2009
1 Edition
43 pages
Product Details
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.