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ISO 21270:2004
Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
SKU: iso_035830_117470
Published by ISO
Publication Year 2004
1 Edition
13 pages
Product Details
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.