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IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
SKU: iec_067111_113470
Published by IEC
Publication Year 2023
1.0 Edition
30 pages
Product Details
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.