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IEC 62047-40:2021
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
SKU: iec_065514_110704
Published by IEC
Publication Year 2021
1.0 Edition
11 pages
Product Details
IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.