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IEC TS 63202-2:2021
Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
SKU: iec_061734_111339
Published by IEC
Publication Year 2021
1.0 Edition
19 pages
Product Details
IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.