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IEC 61701:2020
Photovoltaic (PV) modules - Salt mist corrosion testing
SKU: iec_059588_108036
Published by IEC
Publication Year 2020
3.0 Edition
30 pages
Product Details
IEC 61701:2020 describes test sequences useful to determine the resistance of different PV modules to corrosion from salt mist containing Cl (NaCl, MgCl2, etc.). All tests included in the sequences are fully described in IEC 61215-2, IEC 62108, IEC 61730-2 and IEC 60068-2-52. The bypass diode functionality test in this document is modified from its description in IEC 61215-2. They are combined in this document to provide means to evaluate possible faults caused in PV modules when operating under wet atmospheres having high concentration of dissolved salt (NaCl). Depending on the specific nature of the surrounding atmosphere to which the module is exposed in real operation several testing methods can be applied, as defined in IEC 60068-2-52. Guidance for determining the applicability of this document and selecting an appropriate method is provided in Annex A.
This third edition cancels and replaces the second edition issued in 2011. The main technical changes with respect to the previous edition are as follows:
- The scope has been updated to better reflect the applicability of the Standard
- Test methods and requirements have been condensed and aligned with the new editions of IEC 61215-1, IEC 61215-2, and IEC 61730-2. References to crystalline silicon versus thin film technologies have been eliminated. The old Figure 2 on the thin film test sequence has been eliminated.
- The salt mist test references have been updated to harmonize with changes to IEC 60068-2-52.
- A normative annex has been added to provide guidance on which of the test methods in IEC 60068-2-52 are applicable to different applications. This includes references to new test methods in the latest edition of IEC 60068-2-52.
This third edition cancels and replaces the second edition issued in 2011. The main technical changes with respect to the previous edition are as follows:
- The scope has been updated to better reflect the applicability of the Standard
- Test methods and requirements have been condensed and aligned with the new editions of IEC 61215-1, IEC 61215-2, and IEC 61730-2. References to crystalline silicon versus thin film technologies have been eliminated. The old Figure 2 on the thin film test sequence has been eliminated.
- The salt mist test references have been updated to harmonize with changes to IEC 60068-2-52.
- A normative annex has been added to provide guidance on which of the test methods in IEC 60068-2-52 are applicable to different applications. This includes references to new test methods in the latest edition of IEC 60068-2-52.
