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IEC TS 62607-6-11:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
SKU: iec_033187_111487
Published by IEC
Publication Year 2022
1.0 Edition
27 pages
Product Details
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy