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IEC 62899-503-1:2020
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
SKU: iec_031901_108202
Published by IEC
Publication Year 2020
1.0 Edition
15 pages
Product Details
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).