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IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
SKU: iec_006991_043949
Published by IEC
Publication Year 2010
1.0 Edition
20 pages
Product Details
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.