Codes & Standards - Purchase
IEC 62374-1:2010
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
SKU: iec_006939_044535
Published by IEC
Publication Year 2010
1.0 Edition
32 pages
Product Details
IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.