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IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
SKU: iec_006938_036366
Published by IEC
Publication Year 2006
1.0 Edition
27 pages
Product Details
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)