Codes & Standards - Purchase
IEC 61954:2011+AMD1:2013 CSV
a) Definitions of terms thyristor level, valve section, valve base electronics and redundant thyristor levels have been changed for clarification;
b) Conditions of testing thyristor valve sections instead of a complete thyristor valve have been defined;
c) The requirement has been added that if, following a type test, one thyristor level has become short-circuited, then the failed level shall be restored and this type test repeated;
d) The time period of increasing the initial test voltage from 50 % to 100 % during type a.c. dielectric tests on TSC, TCR or TSR valves has been set equal to approximately 10 s;
e) The duration of test voltage Uts2 during type a.c.-d.c. dielectric tests between TSC valve terminals and earth as well as the duration of test voltage Utvv2 during dielectric tests between TSC valves (for MVU only) has been changed from 30 min to 3 h;
f) The reference on the number of pulses per minute of the periodic partial discharge recorded during a.c.-d.c. dielectric tests on TSC valves and exceeding the permissible level has been deleted. This consolidated version consists of the second edition (2011) and its amendment 1 (2013). Therefore, no need to order amendment in addition to this publication.