Codes & Standards - Purchase
IEC 60749-8:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
SKU: iec_003395_029161
Published by IEC
Publication Year 2002
1.0 Edition
31 pages
Product Details
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.