Codes & Standards - Purchase
IEC 60749-2:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
SKU: iec_003353_031006
Published by IEC
Publication Year 2003
1.0 Edition
Product Details
Modification of the validity date: now put at 2007.