Codes & Standards - Purchase

IEC 60748-20-1:1994

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

SKU: iec_003311_017193 Published by IEC Publication Year 1994 1.0 Edition 55 pages

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Overview

The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

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Bilingual

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PDF

GST REG No R119441681
QST REG No R1006017360

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Codes & Standards - Purchase

IEC 60748-20-1:1994

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