Codes & Standards - Purchase
IEC 60512-6-2:2002
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
SKU: iec_002401_028522
Published by IEC
Publication Year 2002
1.0 Edition
9 pages
Product Details
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.