ISO 20579-1:2024
Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis
détails du produit
This document also includes normative annexes as an aid to understanding the special sample handling techniques and storage requirements of surface chemical analysis techniques, particularly: Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), and X-ray photoelectron spectroscopy (XPS). The information presented can also be applicable for other analytical techniques, such as total reflection X-ray fluorescence spectroscopy (TXRF), that is sensitive to surface composition, and scanning probe microscopy (SPM), that is sensitive to surface morphology.
This document does not define the nature of instrumentation or operating procedures needed to ensure that the analytical measurements described have been appropriately conducted.