ISO 28600:2011
Surface chemical analysis -- Data transfer format for scanning-probe microscopy
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The format is designed for the data of SPM such as scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and related surface analytical methods using pointed probes scanned over sample surfaces. The format covers the data taken by single-channel imaging, multiple-channel imaging and single-point spectroscopy. The format can be expanded to two-dimensional spectroscopy mapping in a future version.