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IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
SKU: iec_060680_102824
Publié par IEC
Année de publication 2017
1.0 Edition
17 pages
détails du produit
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.