Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication technology - Measurement method of impact resistance of nanostructures

Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device

Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures

Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Dispositifs à semiconducteurs - Partie 15: Dispositifs discrets - Dispositifs de puissance à semiconducteurs isolés

Dispositifs à semiconducteurs - Partie 16-9: Circuits intégrés hyperfréquences - Déphaseurs

Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy

Dispositifs à semiconducteurs - Partie 16-7: Circuits intégrés hyperfréquences - Atténuateurs

Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1: Méthode d’essai de détection de variation acoustique

Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence